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Wafer-Level Atomic Force Microscoperoscope

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Wafer-Level Atomic Force Microscoperoscope

Name: WaferLevel Atomic Force Microscoperoscope
Brand: Truth Instruments
Price: 1 USD

Brand Name : Truth Instruments

Model Number : AtomEdge Pro

Place of Origin : CHINA

MOQ : 1

Price : Price Negotiable | Contact us for a detailed quote

Payment Terms : T/T

Name : Atomic Force Microscopes

Scanning Angle : 0~360"

Scanning Range : Maximum 100μm * 100μm * 910μm

Sample Size : Compatible with 8-inch wafers and below

Multi-Function Measurement : EFM,KFM,PFM,MFM

Scan Speed : 0.1Hz-30Hz

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Wafer-Level Atomic Force Microscope

Product Model:

AtomMax

Product Overview:

Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations for laser alignment, probe approach, and scanning parameter adjust.ments.

Equipment Performance Specifications

Parameter	Specification
Sample Size	Compatible with 8-inch wafers and below
Scanning Range	Maximum 100μm * 100μm * 910μm
Scanning Angle	0~360"
Resolution	Z-axis closed-loop resolution 0.15 nm; X/Y closed-loop resolution 0.5 nm
Scanning Probe XY Direction lmage Resolution	Not less than 32x32~4000x4000
Operating Modes	Contact mode, tapping mode, phase imaging mode, lift mode, multi-directional scanning mode
Multi-Function Measurement	EFM,KFM,PFM,MFM

Application Cases

Wafer-Level Atomic Force Microscoperoscope

Potential of the Au-Ti strip electrode sheet
Scanning mode: KPFM (lift-mode)
Scanning range: 18μm * 18μmTitanium Film - Aluminum Titanate Film

Wafer-Level Atomic Force Microscoperoscope

Electrostatic force of the Au-Ti strip electrode sheet
Scanning mode: EFM (lift mode)
Scanning range: 18μm * 18μm

Wafer-Level Atomic Force Microscoperoscope

Magnetic domains in Fe-Ni thin films
Scanning mode: MFM (lift-mode)
Scanning range: 14μm * 14μm

Wafer-Level Atomic Force Microscoperoscope

PbTiO3-piezoelectric corresponding vertical amplitude image
Scanning mode: PFM (contact-mode)
Scanning range: 20μm * 20μm

Co/Pt Thin Film
Scanning Mode: Magnetic Force Microscopy (MFM)
Scanning Range: 25 μm * 25 μm

Product Tags:

Wafer Level Atomic Force Microscopes

Atomic Force Microscopes 0.1Hz

30Hz Probe Microscope

Wafer-Level Atomic Force Microscoperoscope Manufactures

Wafer-Level Atomic Force Microscoperoscope Images

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